no code implementations • 5 Mar 2021 • Sourav De, Bo-Han Qiu, Wei-Xuan Bu, Md. Aftab Baig, Chung-Jun Su, Yao-Jen Lee, Darsen Lu
This paper reports a comprehensive study on the impacts of temperature-change, process variation, flicker noise and device aging on the inference accuracy of pre-trained all-ferroelectric (FE) FinFET deep neural networks.
no code implementations • 3 Mar 2021 • Sourav De, Hoang-Hiep Le, Md. Aftab Baig, Yao-Jen Lee, Darsen D. Lu, Thomas Kämpfe
This paper reports the impacts of temperature variation on the inference accuracy of pre-trained all-ferroelectric FinFET deep neural networks, along with plausible design techniques to abate these impacts.
no code implementations • 26 Jul 2020 • Jhang-Yan Ciou, Sourav De, Chien-Wei-Wang, Wallace Lin, Yao-Jen Lee, Darsen Lu
This study simulated negative-capacitance double gate FinFETs with channel lengths ranging from 25nm to 100nm using TCAD.
Applied Physics