no code implementations • 28 Jul 2022 • Markus Osenberg, André Hilger, Matthias Neumann, Amalia Wagner, Nicole Bohn, Joachim R. Binder, Volker Schmidt, John Banhart, Ingo Manke
FIB/SEM tomography represents an indispensable tool for the characterization of three-dimensional nanostructures in battery research and many other fields.