Iterative Cluster Harvesting for Wafer Map Defect Patterns

no code implementations • 23 Apr 2024 • Alina Pleli, Simon Baeuerle, Michel Janus, Jonas Barth, Ralf Mikut, Hendrik P. A. Lensch

Unsupervised clustering of wafer map defect patterns is challenging because the appearance of certain defect patterns varies significantly.

Clustering Dimensionality Reduction