Iterative Cluster Harvesting for Wafer Map Defect Patterns

no code implementations • 23 Apr 2024 • Alina Pleli, Simon Baeuerle, Michel Janus, Jonas Barth, Ralf Mikut, Hendrik P. A. Lensch

Unsupervised clustering of wafer map defect patterns is challenging because the appearance of certain defect patterns varies significantly.

Clustering Dimensionality Reduction

Rapid Flow Behavior Modeling of Thermal Interface Materials Using Deep Neural Networks

no code implementations • 8 Aug 2022 • Simon Baeuerle, Marius Gebhardt, Jonas Barth, Andreas Steimer, Ralf Mikut

For more complex geometries, Computational Fluid Dynamics (CFD) simulations are used in combination with manual experiments.

Management

CAD2Real: Deep learning with domain randomization of CAD data for 3D pose estimation of electronic control unit housings

no code implementations • 25 Sep 2020 • Simon Baeuerle, Jonas Barth, Elton Renato Tavares de Menezes, Andreas Steimer, Ralf Mikut

Electronic control units (ECUs) are essential for many automobile components, e. g. engine, anti-lock braking system (ABS), steering and airbags.

3D Pose Estimation