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Periodic Artifact Reduction in Fourier transforms of Full Field Atomic Resolution Images
In this method, edge artifacts are reduced by subtracting a smooth background that solves Poisson's equation with boundary conditions set by the image's edges.
Sampling Limits for Electron Tomography with Sparsity-exploiting Reconstructions
Popularized by compressed sensing, sparsity-exploiting algorithms have been applied to experimental ET data and show promise for improving reconstruction quality or reducing the total beam dose applied to a specimen.
Removing Stripes, Scratches, and Curtaining with Non-Recoverable Compressed Sensing
Highly-directional image artifacts such as ion mill curtaining, mechanical scratches, or image striping from beam instability degrade the interpretability of micrographs.
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