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Wafer Map Defect Patterns Semi-Supervised Classification Using Latent Vector Representation
In this paper, we propose a method that initially employs a pre-trained VAE model to obtain the fault distribution information of the wafer map.
A Deeply Supervised Semantic Segmentation Method Based on GAN
In recent years, the field of intelligent transportation has witnessed rapid advancements, driven by the increasing demand for automation and efficiency in transportation systems.
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