no code implementations • 25 Jan 2022 • Kyohei Shimozato, Michihiro Shintani, Takashi Sato
Outlier detection of semiconductor devices is important since manufacturing variation is inherently inevitable.
no code implementations • 22 Oct 2021 • Michihiro Shintani, Aoi Ueda, Takashi Sato
The extraction of the model parameters is as important as the development of compact model itself because simulation accuracy is fully determined by the accuracy of the parameters used.