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Dynamic Structured Illumination Microscopy with a Neural Space-time Model
We propose a new method, Speckle Flow SIM, that uses static patterned illumination with moving samples and models the sample motion during data capture in order to reconstruct the dynamic scene with super-resolution.
Structured illumination microscopy with unknown patterns and a statistical prior
Structured illumination microscopy (SIM) improves resolution by down-modulating high-frequency information of an object to fit within the passband of the optical system.
Experimental robustness of Fourier Ptychography phase retrieval algorithms
Both noise (e. g. Poisson noise) and model mis-match errors are shown to scale with intensity.
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