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On Improving Hotspot Detection Through Synthetic Pattern-Based Database Enhancement
Continuous technology scaling and the introduction of advanced technology nodes in Integrated Circuit (IC) fabrication is constantly exposing new manufacturability issues.
Bias Busters: Robustifying DL-based Lithographic Hotspot Detectors Against Backdooring Attacks
Deep learning (DL) offers potential improvements throughout the CAD tool-flow, one promising application being lithographic hotspot detection.
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