no code implementations • 8 Nov 2022 • Zhikang Zhang, Bruno Machado Trindade, Michael Green, Zifan Yu, Christopher Pawlowicz, Fengbo Ren
Due to the complicated nanoscale structures of current integrated circuits(IC) builds and low error tolerance of IC image segmentation tasks, most existing automated IC image segmentation approaches require human experts for visual inspection to ensure correctness, which is one of the major bottlenecks in large-scale industrial applications.