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Found 4 papers, 0 papers with code
Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy
However, a significant increase in stochastic defects and the complexity of defect detection becomes more pronounced with high-NA.
SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection
We have proposed SEMI-CenterNet (SEMI-CN), a customized CN architecture trained on SEM images of semiconductor wafer defects.
SEMI-DiffusionInst: A Diffusion Model Based Approach for Semiconductor Defect Classification and Segmentation
To the best of the authors' knowledge, this work is the first demonstration to accurately detect and precisely segment semiconductor defect patterns by using a diffusion model.
Nanomagnetic Self-Organizing Logic Gates
Despite the realization of several proofs of concepts of such nanomagnetic logic[13-15], it is still unclear what the advantages are compared to the widespread CMOS designs, due to their need for clocking[16, 17] and/or thermal annealing [18, 19] for which fast convergence to the ground state is not guaranteed.
Combinatorial Optimization
Mesoscale and Nanoscale Physics
Adaptation and Self-Organizing Systems
