Precision measurements of electric-field-induced frequency displacements of an ultranarrow optical transition in ions in a solid
We report a series of measurements of the effect of an electric field on the frequency of the ultranarrow linewidth $^7F_0 \rightarrow$ $^5D_0$ optical transition of $\rm Eu^{3+}$ ions in an $\rm Y_2SiO_5$ matrix at cryogenic temperatures. We provide linear Stark coefficients along two dielectric axes and for the two different substitution sites of the $\rm Eu^{3+}$ ions, with an unprecedented accuracy, and an upper limit for the quadratic Stark shift. The measurements, which indicate that the electric field sensitivity is a factor of seven larger for site 1 relative to site 2 for a particular direction of the electric field are of direct interest both in the context of quantum information processing and laser frequency stabilization with rare-earth doped crystals, in which electric fields can be used to engineer experimental protocols by tuning transition frequencies.
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