Metrological Detection of Multipartite Entanglement from Young Diagrams

7 Dec 2020  ·  Zhihong Ren, Weidong Li, Augusto Smerzi, Manuel Gessner ·

We characterize metrologically useful multipartite entanglement by representing partitions with Young diagrams. We derive entanglement witnesses that are sensitive to the shape of Young diagrams and show that Dyson's rank acts as a resource for quantum metrology. Common quantifiers, such as the entanglement depth and $k$-separability are contained in this approach as the diagram's width and height. Our methods are experimentally accessible in a wide range of atomic systems, as we illustrate by analyzing published data on the quantum Fisher information and spin-squeezing coefficients.

PDF Abstract
No code implementations yet. Submit your code now

Categories


Quantum Physics